Exploring Environmental Factors Affecting Strawberry Yield Using Pattern Recognition Techniques
Wanhyun Cho, Yuha Park, Myung Hwan Na, Don-Woo Choi, Journal of Internet Computing and Services, Vol. 20, No. 1, pp. 39-46, Feb. 2019
10.7472/jksii.2019.20.1.39, Full Text:
Keywords: Strawberry yields, Environmental factors, Graphic Analysis Method, Dynamic time warping, Multidimensional Scaling Method
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Cite this article
[APA Style]
Cho, W., Park, Y., Na, M., & Choi, D. (2019). Exploring Environmental Factors Affecting Strawberry Yield Using Pattern Recognition Techniques. Journal of Internet Computing and Services, 20(1), 39-46. DOI: 10.7472/jksii.2019.20.1.39.
[IEEE Style]
W. Cho, Y. Park, M. H. Na, D. Choi, "Exploring Environmental Factors Affecting Strawberry Yield Using Pattern Recognition Techniques," Journal of Internet Computing and Services, vol. 20, no. 1, pp. 39-46, 2019. DOI: 10.7472/jksii.2019.20.1.39.
[ACM Style]
Wanhyun Cho, Yuha Park, Myung Hwan Na, and Don-Woo Choi. 2019. Exploring Environmental Factors Affecting Strawberry Yield Using Pattern Recognition Techniques. Journal of Internet Computing and Services, 20, 1, (2019), 39-46. DOI: 10.7472/jksii.2019.20.1.39.