A Study on Log Collection to Analyze Causes of Malware Infection in IoT Devices in Smart city Environments
Donghyun Kim, Jiho Shin, Jung Taek Seo, Journal of Internet Computing and Services, Vol. 24, No. 1, pp. 17-26, Feb. 2023
10.7472/jksii.2023.24.1.17, Full Text:
Keywords: Smart City, Internet of Things, Malware, Massive IoT, MITRE ATT&CK
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Cite this article
[APA Style]
Kim, D., Shin, J., & Seo, J. (2023). A Study on Log Collection to Analyze Causes of Malware Infection in IoT Devices in Smart city Environments. Journal of Internet Computing and Services, 24(1), 17-26. DOI: 10.7472/jksii.2023.24.1.17.
[IEEE Style]
D. Kim, J. Shin, J. T. Seo, "A Study on Log Collection to Analyze Causes of Malware Infection in IoT Devices in Smart city Environments," Journal of Internet Computing and Services, vol. 24, no. 1, pp. 17-26, 2023. DOI: 10.7472/jksii.2023.24.1.17.
[ACM Style]
Donghyun Kim, Jiho Shin, and Jung Taek Seo. 2023. A Study on Log Collection to Analyze Causes of Malware Infection in IoT Devices in Smart city Environments. Journal of Internet Computing and Services, 24, 1, (2023), 17-26. DOI: 10.7472/jksii.2023.24.1.17.