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Search: "[ author: Kyeongsic Min ]" (2)
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Kyeongsic Min, Jung-Won Lee, Byungjeong Lee, Vol. 20, No. 6, pp. 37-46, Dec. 2019
10.7472/jksii.2019.20.6.37
Keywords: Test Strategy Reuse, Test Plan Reuse, ISO/IEC 25010, ISO/IEC 25023, ISO/IEC 29119 -
Dongju Jung, Kyeongsic Min, Jung-Won Lee, Byungjeong Lee, Vol. 20, No. 2, pp. 29-37, Apr. 2019
10.7472/jksii.2019.20.2.29
Keywords: Fault traceability, Bug Report, Commit Information
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